Trademark Details For XDLM (Serial Number 75559896)

Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, [ electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments, ] instruments for measuring thickness of coatings, alloy compositions, material analysis, [ porosity, electrical conductivity, ] ferrite content, [ micro-hardness, ] and other properties of coatings and layers; [ magneto, -opto, -and electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] computers and data processors for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; [ thickness measurement instruments that use ultra sound ] and electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; X-ray detectors; X-ray tubes not for medical purposes; computer software for use in controlling the scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results;

training the use and operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; providing on-line training via a global computer network in the use and operation of scientific, electrical monitoring and measuring instruments and computers and software used therein;

product development for others; computer software consultation for others; technical consultation in the field of scientific, electrical, optical monitoring and measuring apparatuses and instruments and computers and software used therein; providing on-line consultation via a global computer network in the field of software used therein; computer services, namely designing and implementing web sites for others;